Microwave Electronics Measurement and Materials Characterization by C. K. Ong, C. P. Neo, L. F. Chen, V. V. Varadan, Vijay K. Varadan

Microwave Electronics Measurement and Materials Characterization



Download Microwave Electronics Measurement and Materials Characterization




Microwave Electronics Measurement and Materials Characterization C. K. Ong, C. P. Neo, L. F. Chen, V. V. Varadan, Vijay K. Varadan
Language: English
Page: 549
Format: pdf
ISBN: 0470844922, 9780470844922
Publisher: Wiley

This topic is the subject of intense research and development since microwave materials form the hardware components of the present wireless telecommunications revolution. Featuring current technology developments, this book examines every aspect of microwave material properties, measurement techniques, circuit design and application. A concise introduction to microwave theory is provided, along with an outline of the methods used to characterise microwave material properties. The authors then go on to cover both established and emerging techniques in microwave measurement in detail. Practical examples of the use of microwave materials across a range of fields, including high-speed electronics, bio-engineering, defence systems and remote sensing, are presented along with guidance on the application of microwave theory and the appropriate measurement techniques. The final chapters look ahead to the future application requirements from microwave materials and challenges in the characterisation of materials microwave properties. The authors are highly experienced in this field and combine many years of industrial and academic experience. Provides a comprehensive introduction to microwave theory and microwave measurement techniques Presents materials property characterisation methods along with a discussion of the underlying theory Provides guidance on the development of suitable measurement methodologies tailored for a variety of materials and application requirements Brings together in one publication, coverage of a broad range of measurement methodologies, for the first time Covers the principles and methods for development of smart materials and smart structures Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing, bio-engineering and the physical sciences

A valuable addition to the bookshelf of all practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar.   The authoritative approach also makes this ideal for senior students and researchers in RF and microwave engineering and microelectronics and material scientists.

From the Back Cover

The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book: Provides a comprehensive introduction to microwave theory and microwave measurement techniques. Examines every aspect of microwave material properties, circuit design and applications. Presents materials property characterisation methods along with a discussion of the underlying theory. Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications. Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.

This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.

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